Improved blades for RF testing at wafer


Tunaboylu B.

ELECTRONICS LETTERS, cilt.47, sa.25, ss.1396-1397, 2011 (SCI İndekslerine Giren Dergi) identifier identifier

  • Cilt numarası: 47 Konu: 25
  • Basım Tarihi: 2011
  • Doi Numarası: 10.1049/el.2011.2563
  • Dergi Adı: ELECTRONICS LETTERS
  • Sayfa Sayıları: ss.1396-1397

Özet

An improved design for a blade utilised in a probe card is presented. The comparison is made with a current blade design and prototype test cards were manufactured for the study. Measurement results on S-parameters are reported on test cards with the new design and new blade material.