Improved blades for RF testing at wafer
ELECTRONICS LETTERS, cilt.47, sa.25, ss.1396-1397, 2011 (SCI-Expanded)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 47 Sayı: 25
- Basım Tarihi: 2011
- Doi Numarası: 10.1049/el.2011.2563
- Dergi Adı: ELECTRONICS LETTERS
- Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
- Sayfa Sayıları: ss.1396-1397
- Marmara Üniversitesi Adresli: Hayır
Özet
An improved design for a blade utilised in a probe card is presented. The comparison is made with a current blade design and prototype test cards were manufactured for the study. Measurement results on S-parameters are reported on test cards with the new design and new blade material.