Tunaboylu, B. 2011. Improved blades for RF testing at wafer. ELECTRONICS LETTERS , vol.47, no.25 , 1396-1397.

Tunaboylu, B., (2011). Improved blades for RF testing at wafer. ELECTRONICS LETTERS , vol.47, no.25, 1396-1397.

Tunaboylu, BAHADIR. "Improved blades for RF testing at wafer," ELECTRONICS LETTERS , vol.47, no.25, 1396-1397, 2011

Tunaboylu, BAHADIR. "Improved blades for RF testing at wafer." ELECTRONICS LETTERS , vol.47, no.25, pp.1396-1397, 2011

Tunaboylu, B. (2011) . "Improved blades for RF testing at wafer." ELECTRONICS LETTERS , vol.47, no.25, pp.1396-1397.

@article{article, author={BAHADIR TUNABOYLU}, title={Improved blades for RF testing at wafer}, journal={ELECTRONICS LETTERS}, year=2011, pages={1396-1397} }