Europium incorporation dynamics and some physical investigations within ZnO sprayed thin films


Kamoun O., Boukhachem A., Yumak A. , Petkova P., Boubaker K., Amlouk M.

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, cilt.43, ss.8-16, 2016 (SCI İndekslerine Giren Dergi) identifier identifier

  • Cilt numarası: 43
  • Basım Tarihi: 2016
  • Doi Numarası: 10.1016/j.mssp.2015.11.005
  • Dergi Adı: MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
  • Sayfa Sayıları: ss.8-16

Özet

Europium doped ZnO thin films were deposited on glass substrates using a simple mini spray technique at 460 degrees C. The structural properties of as-prepared thin films were characterized by X-ray diffraction (XRD). Both undoped and Eu-doped films show strong preferred c-axis orientation. The maximum value of the volume cells was obtained at 1% doping level. The texture coefficient (TC) of the films along (002) direction changes with the doping level due to Eu incorporation.