MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, cilt.43, ss.8-16, 2016 (SCI-Expanded)
Europium doped ZnO thin films were deposited on glass substrates using a simple mini spray technique at 460 degrees C. The structural properties of as-prepared thin films were characterized by X-ray diffraction (XRD). Both undoped and Eu-doped films show strong preferred c-axis orientation. The maximum value of the volume cells was obtained at 1% doping level. The texture coefficient (TC) of the films along (002) direction changes with the doping level due to Eu incorporation.