Characterization of Au capped Si Nanowhiskers by XRD SEM and Semiconducting Analysis

ŞEKER İ., YANIK S., KARAKIZ M.

International Semiconductor Science and Technology Conference, Aydın, Turkey, 11 - 13 May 2015, (Summary Text)

• Publication Type: Conference Paper / Summary Text
• City: Aydın
• Country: Turkey
• Marmara University Affiliated: Yes