Mitigating tin ion migration and reinforcing buried interface via synergistic polymer-modified tin oxide
Nature Communications, cilt.17, sa.1, 2026 (SCI-Expanded, Scopus)
- Yayın Türü: Makale / Tam Makale
- Cilt numarası: 17 Sayı: 1
- Basım Tarihi: 2026
- Doi Numarası: 10.1038/s41467-026-77624-8
- Dergi Adı: Nature Communications
- Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Aerospace Database, BIOSIS, Chemical Abstracts Core, EMBASE, Geobase, INSPEC, MEDLINE, Directory of Open Access Journals, Zoological Record, Natural Science Collection (ProQuest), Biological Science Database (ProQuest), Health Research Premium Collection (ProQuest), Pharma Collection (ProQuest), Technology Collection (ProQuest)
- Marmara Üniversitesi Adresli: Evet
Özet
The buried interface between the charge transport layer and the overlying perovskite absorber is critical yet difficult to probe in perovskite solar cells. Because light enters through the transparent substrate and is predominantly absorbed near this region, photo-induced degradation processes are partially initiated at the hidden buried interface. Here, we reveal that instability at the buried SnO2/perovskite interface triggers structural and chemical decomposition of the perovskite layer. To address this issue, we introduce polymeric interlayers that simultaneously reinforce interfacial bonding and suppress tin-ion migration. Poly(1-ethenylpyrrolidine-2,5-dione) (PED) forms a robust and chemically compatible interface, yielding enhanced phase purity, reduced defect density, and significantly mitigated tin diffusion. These findings identify the buried SnO2/perovskite interface as a key degradation-sensitive region under light aging and highlight interfacial polymer design as an effective strategy for improving the intrinsic stability of perovskite photovoltaics.