Simplifying the Complex: A Lean VSM Approach in Semiconductor Processes
LNME AI-Driven Production with Green Sustainability, N M Durakbasa,H. C Akdağ,K. Güven Gülen, Editör, Springer Nature Switzerland Ag, Zug, ss.518-534, 2026
- Yayın Türü: Kitapta Bölüm / Araştırma Kitabı
- Basım Tarihi: 2026
- Doi Numarası: 10.1007/978-3-032-22784-3_44
- Yayınevi: Springer Nature Switzerland Ag
- Basıldığı Şehir: Zug
- Sayfa Sayıları: ss.518-534
- Editörler: N M Durakbasa,H. C Akdağ,K. Güven Gülen, Editör
- Marmara Üniversitesi Adresli: Evet
Özet
Semiconductor manufacturing processes are among the complex man-ufacturing systems due to their multi-stage and high-precision structures. In these processes, balancing production efficiency and technical innovations at the same time has become a strategic necessity for businesses. The Value Stream Mapping (VSM) method, one of the tools used to make production flows visible and iden-tify bottlenecks, offers a lean production-based analysis approach to establish this balance.
This study analyzes semiconductor manufacturing processes within the frame-work of the lean manufacturing approach by visualizing the general flows of the process from the customer’s demand to the delivery of the final product and iden-tifying non-value-adding steps, bottlenecks and wastes in the process. As a scope, due to the complexity of semiconductor manufacturing processes, a VSM analy-sis was performed that categorizes wafer processes into 8 basic groups; the cycle times of each group were calculated and compared with the takt time determined according to customer demand. With this analysis, bottlenecks and improvement areas in the process were identified and solutions were developed in accordance with lean manufacturing principles.