This work deals with structural and electrical investigations on ZnO-Zn2SnO4 sprayed thin films grown on glass substrates at 460 degrees C. The structural, morphological and optical properties were investigated using X-ray diffraction (XRD), atomic force microscopy (AFM), and UV-visible spectrophotometry. XRD results describe the existence of the ZnO and Zn2SnO4 phases for various temperatures. AFM micrographs indicate the increase of roughness by increasing temperature. Finally, the electrical conductivity, conduction mechanism, relaxation model of these films was indeed studied by means of the impedance spectroscopy technique in the frequency range 5 Hz-13 MHz at various temperatures (220-280 degrees C). Besides, the frequency and temperature dependence of AC conductivity measurements, as well as Lattice Compatibility Theory (LCT) patterns, have been analyzed under the structural change framework when the annealing process is undertaken. (C) 2015 Elsevier B.V. All rights reserved.