Atıf İçin Kopyala
Atar E., Sarioglu C., Demirler U., Kayali E., Cimenoglu H.
SCRIPTA MATERIALIA, cilt.48, sa.9, ss.1331-1336, 2003 (SCI-Expanded)
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Yayın Türü:
Makale / Tam Makale
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Cilt numarası:
48
Sayı:
9
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Basım Tarihi:
2003
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Doi Numarası:
10.1016/s1359-6462(03)00019-8
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Dergi Adı:
SCRIPTA MATERIALIA
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Derginin Tarandığı İndeksler:
Science Citation Index Expanded (SCI-EXPANDED), Scopus
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Sayfa Sayıları:
ss.1331-1336
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Anahtar Kelimeler:
microindentation, residual stresses, thin films, X-ray diffraction, SHARP INDENTATION, STRAIN FIELDS, SURFACE, TIN
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Marmara Üniversitesi Adresli:
Evet
Özet
The residual stresses in ceramic thin films obtained by the indentation method have been found to be three times higher than those of the X-ray diffraction method. This discrepancy can be eliminated by setting the geometrical factor for the Vickers pyramid indenter to 1 in the relevant equation of the indentation method. (C) 2003 Acta Materialia Inc. Published by Elsevier Science Ltd. All rights reserved.