MICROELECTRONIC ENGINEERING, cilt.205, ss.59-62, 2019 (SCI-Expanded)
We report the important performance parameters of SiC-NWFET devices including on/off current ratio (I-on/I-off), gating effect, transconductance (g(m)), and carrier mobility (mu(h)). The channel length dependence of these key performance parameters of the SiC-NWFETs with varying channel lengths ranging from 120 nm to 1.5 mu m has been demonstrated. The device with the 120 nm channel length has led to a very high on/off current ratio (1.34 x 10(4)) and very strong gating effect. Furthermore, the transconductance and the hole mobility have been determined as 6.9 nS and 1.696 cm(2)/V.s, respectively, at V-ds of 0.05 V. This study shows good promise of the SiC-NWFET devices to be used in advanced solid-state nanoelectronic devices capable of operating at high frequency and high temperature.