Improved blades for RF testing at wafer


Tunaboylu B.

ELECTRONICS LETTERS, vol.47, no.25, pp.1396-1397, 2011 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 47 Issue: 25
  • Publication Date: 2011
  • Doi Number: 10.1049/el.2011.2563
  • Title of Journal : ELECTRONICS LETTERS
  • Page Numbers: pp.1396-1397

Abstract

An improved design for a blade utilised in a probe card is presented. The comparison is made with a current blade design and prototype test cards were manufactured for the study. Measurement results on S-parameters are reported on test cards with the new design and new blade material.