İ. ŞEKER Et Al. , "Characterization of Au capped Si Nanowhiskers by XRD SEM and Semiconducting Analysis," International Semiconductor Science and Technology Conference , Aydın, Turkey, 2015
ŞEKER, İ. Et Al. 2015. Characterization of Au capped Si Nanowhiskers by XRD SEM and Semiconducting Analysis. International Semiconductor Science and Technology Conference , (Aydın, Turkey).
ŞEKER, İ., YANIK, S., & KARAKIZ, M., (2015). Characterization of Au capped Si Nanowhiskers by XRD SEM and Semiconducting Analysis . International Semiconductor Science and Technology Conference, Aydın, Turkey
ŞEKER, İSA, SERHAT YANIK, And MEHMET KARAKIZ. "Characterization of Au capped Si Nanowhiskers by XRD SEM and Semiconducting Analysis," International Semiconductor Science and Technology Conference, Aydın, Turkey, 2015
ŞEKER, İSA Et Al. "Characterization of Au capped Si Nanowhiskers by XRD SEM and Semiconducting Analysis." International Semiconductor Science and Technology Conference , Aydın, Turkey, 2015
ŞEKER, İ. YANIK, S. And KARAKIZ, M. (2015) . "Characterization of Au capped Si Nanowhiskers by XRD SEM and Semiconducting Analysis." International Semiconductor Science and Technology Conference , Aydın, Turkey.
@conferencepaper{conferencepaper, author={İSA ŞEKER Et Al. }, title={Characterization of Au capped Si Nanowhiskers by XRD SEM and Semiconducting Analysis}, congress name={International Semiconductor Science and Technology Conference}, city={Aydın}, country={Turkey}, year={2015}}