TUNABOYLU, B. And SOYDAN, A. M. Mems Technologies Enabling The Future WaferTest Systems. 2018. In Mems Sensors - Design And Application , Intechopen, 189-206.

TUNABOYLU, B., & SOYDAN, A. M., (2018). Mems Technologies Enabling The Future WaferTest Systems. Mems Sensors - Design And Application (pp.189-206), Intechopen.

TUNABOYLU, BAHADIR, And ALİ MURAT SOYDAN. "Mems Technologies Enabling The Future WaferTest Systems." In Mems Sensors - Design And Application , 189-206. Intechopen, 2018

TUNABOYLU, BAHADIR And SOYDAN, ALİ M. . "Mems Technologies Enabling The Future WaferTest Systems." Mems Sensors - Design And Application , Intechopen, 2018, pp.189-206.

TUNABOYLU, B. And SOYDAN, A. M. (2018) "Mems Technologies Enabling The Future WaferTest Systems", Mems Sensors - Design And Application . Intechopen.

@bookchapter{bookchapter, author ={BAHADIR TUNABOYLU And author ={ALİ MURAT SOYDAN}, chaptertitle={Mems Technologies Enabling The Future WaferTest Systems}, booktitle={ Mems Sensors - Design And Application}, publisher={Intechopen}, city={},year={2018} }