Z. Ozturk Et Al. , "Soft Error Characterization on Scientific Applications," 16th IEEE Int Conf on Dependable, Autonom and Secure Comp/16th IEEE Int Conf on Pervas Intelligence and Comp/4th IEEE Int Conf on Big Data Intelligence and Comp/3rd IEEE Cyber Sci and Technol Congress (DASC/PiCom/DataCom/CyberSciTech) , Athens, Greece, pp.592-599, 2018
Ozturk, Z. Et Al. 2018. Soft Error Characterization on Scientific Applications. 16th IEEE Int Conf on Dependable, Autonom and Secure Comp/16th IEEE Int Conf on Pervas Intelligence and Comp/4th IEEE Int Conf on Big Data Intelligence and Comp/3rd IEEE Cyber Sci and Technol Congress (DASC/PiCom/DataCom/CyberSciTech) , (Athens, Greece), 592-599.
Ozturk, Z., TOPCUOĞLU, H. R., Arslan, S., & Kandemir, M. T., (2018). Soft Error Characterization on Scientific Applications . 16th IEEE Int Conf on Dependable, Autonom and Secure Comp/16th IEEE Int Conf on Pervas Intelligence and Comp/4th IEEE Int Conf on Big Data Intelligence and Comp/3rd IEEE Cyber Sci and Technol Congress (DASC/PiCom/DataCom/CyberSciTech) (pp.592-599). Athens, Greece
Ozturk, Zuhal Et Al. "Soft Error Characterization on Scientific Applications," 16th IEEE Int Conf on Dependable, Autonom and Secure Comp/16th IEEE Int Conf on Pervas Intelligence and Comp/4th IEEE Int Conf on Big Data Intelligence and Comp/3rd IEEE Cyber Sci and Technol Congress (DASC/PiCom/DataCom/CyberSciTech), Athens, Greece, 2018
Ozturk, Zuhal Et Al. "Soft Error Characterization on Scientific Applications." 16th IEEE Int Conf on Dependable, Autonom and Secure Comp/16th IEEE Int Conf on Pervas Intelligence and Comp/4th IEEE Int Conf on Big Data Intelligence and Comp/3rd IEEE Cyber Sci and Technol Congress (DASC/PiCom/DataCom/CyberSciTech) , Athens, Greece, pp.592-599, 2018
Ozturk, Z. Et Al. (2018) . "Soft Error Characterization on Scientific Applications." 16th IEEE Int Conf on Dependable, Autonom and Secure Comp/16th IEEE Int Conf on Pervas Intelligence and Comp/4th IEEE Int Conf on Big Data Intelligence and Comp/3rd IEEE Cyber Sci and Technol Congress (DASC/PiCom/DataCom/CyberSciTech) , Athens, Greece, pp.592-599.
@conferencepaper{conferencepaper, author={Zuhal Ozturk Et Al. }, title={Soft Error Characterization on Scientific Applications}, congress name={16th IEEE Int Conf on Dependable, Autonom and Secure Comp/16th IEEE Int Conf on Pervas Intelligence and Comp/4th IEEE Int Conf on Big Data Intelligence and Comp/3rd IEEE Cyber Sci and Technol Congress (DASC/PiCom/DataCom/CyberSciTech)}, city={Athens}, country={Greece}, year={2018}, pages={592-599} }