M. A. Abas Et Al. , "Timing Measurement Built-In Self Test (BIST) for System on Chip (SoC)," 8th WSEAS International Conference on Microelectronics, Nanoelectronics, Optoelectronics , İstanbul, Turkey, pp.17-18, 2009
Abas, M. A. Et Al. 2009. Timing Measurement Built-In Self Test (BIST) for System on Chip (SoC). 8th WSEAS International Conference on Microelectronics, Nanoelectronics, Optoelectronics , (İstanbul, Turkey), 17-18.
Abas, M. A., Russell, G., & Kinniment, D. J., (2009). Timing Measurement Built-In Self Test (BIST) for System on Chip (SoC) . 8th WSEAS International Conference on Microelectronics, Nanoelectronics, Optoelectronics (pp.17-18). İstanbul, Turkey
Abas, M., G. Russell, And D. J. Kinniment. "Timing Measurement Built-In Self Test (BIST) for System on Chip (SoC)," 8th WSEAS International Conference on Microelectronics, Nanoelectronics, Optoelectronics, İstanbul, Turkey, 2009
Abas, M. A. Et Al. "Timing Measurement Built-In Self Test (BIST) for System on Chip (SoC)." 8th WSEAS International Conference on Microelectronics, Nanoelectronics, Optoelectronics , İstanbul, Turkey, pp.17-18, 2009
Abas, M. A. Russell, G. And Kinniment, D. J. (2009) . "Timing Measurement Built-In Self Test (BIST) for System on Chip (SoC)." 8th WSEAS International Conference on Microelectronics, Nanoelectronics, Optoelectronics , İstanbul, Turkey, pp.17-18.
@conferencepaper{conferencepaper, author={M. Amir Abas Et Al. }, title={Timing Measurement Built-In Self Test (BIST) for System on Chip (SoC)}, congress name={8th WSEAS International Conference on Microelectronics, Nanoelectronics, Optoelectronics}, city={İstanbul}, country={Turkey}, year={2009}, pages={17-18} }