ALEVLİ, M. And Gungor, N. 2018. Critical Layer Thickness of GaN Thin Films on sapphire grown by hollow-cathode plasma assisted tomic layer deposition. European Materials Research Society Spring 2018 , (France).

ALEVLİ, M., & Gungor, N., (2018). Critical Layer Thickness of GaN Thin Films on sapphire grown by hollow-cathode plasma assisted tomic layer deposition . European Materials Research Society Spring 2018, France

ALEVLİ, MUSTAFA, And Nese Gungor. "Critical Layer Thickness of GaN Thin Films on sapphire grown by hollow-cathode plasma assisted tomic layer deposition," European Materials Research Society Spring 2018, France, 2018

ALEVLİ, MUSTAFA And Gungor, Nese. "Critical Layer Thickness of GaN Thin Films on sapphire grown by hollow-cathode plasma assisted tomic layer deposition." European Materials Research Society Spring 2018 , France, 2018

ALEVLİ, M. And Gungor, N. (2018) . "Critical Layer Thickness of GaN Thin Films on sapphire grown by hollow-cathode plasma assisted tomic layer deposition." European Materials Research Society Spring 2018 , France.

@conferencepaper{conferencepaper, author={MUSTAFA ALEVLİ And author={Nese Gungor}, title={Critical Layer Thickness of GaN Thin Films on sapphire grown by hollow-cathode plasma assisted tomic layer deposition}, congress name={European Materials Research Society Spring 2018}, city={}, country={France}, year={2018}}